Modification of Er:YbAG film microstructure with a sintering agent

27th Joint Seminar Development of Materials Science in Research and Education

材料科学;教育

Jake, V.^1 ; Polák, V.^1 ; Rubeová, K.^1 ; Hlásek, T.^1 ; Mikoláová, D.^1 ; Nádherný, L.^1 ; Nekvindová, P.^1 ; Oswald, J.^2

University of Chemistry and Technology Prague, Department of Inorganic Chemistry, Technická 5, Prague 6

166 28, Czech Republic^1

Institute of Physics, Czech Academy of Sciences, Cukrovarnická 10, Prague 6

162 00, Czech Republic^2

关键词: Ambient pressures;    Film microstructures;    Fused silica substrates;    Polycrystalline;    Sintering agents;    Two parameter;    Waveguiding films;    Williamson-hall analysis;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/266/1/012004/pdf
DOI  :  10.1088/1757-899X/266/1/012004

来源: IOP

【 摘 要 】

Thin films of erbium doped YbAG were prepared by spin-coating on fused silica substrates. The effect of two parameters on the microstructure of resulting films was observed: addition of a sintering agent (TEOS) to the solution deposited and crystallization under decreased atmosphere (100 mbar). All prepared samples were polycrystalline single phase YbAG. When comparing the reference (TEOS-free) samples crystallized in ambient pressure, the films with TEOS in a combination with decreased pressure during the crystallization had a smaller crystallite size and finer surface, as confirmed by AFM and Williamson-Hall analyses. A higher amount of TEOS caused cracking of the films though. All films containing TEOS were one-mode waveguides in the NIR region. This paper shows a way to modify microstructure of a waveguiding film via addition of a sintering agent without destroying the waveguiding ability.