The generation of the electrical oscillations in a contact of an AFM probe to an individual Au nanoparticle in a SiO2/Si film

Scanning Probe Microscopy 2017

Filatov, D.O.^1 ; Gorshkov, O.N.^1,2 ; Antonov, D.A.^1 ; Shenina, M.E.^1 ; Sinutkin, D.Yu.^3 ; Zenkevich, A.V.^4 ; Matveev, Yu A.^4

Research and Education Center for Physics of Solid State Nanostructures, Lobachevskii State University of Nizhnii Novgorod, Nizhnii, Novgorod

603950, Russia^1

Research Institute for Physics and Technology, Lobachevskii State University of Nizhnii Novgorod, Nizhnii, Novgorod

603950, Russia^2

Department of Physics, Lobachevskii State University of Nizhnii Novgorod, Nizhnii, Novgorod

603950, Russia^3

Moscow Institute of Physics and Technology, Moscow

141701, Russia^4

关键词: AFM probe;    Conductive probe;    Nanoelectronic devices;    Negative differential resistances;    Si substrates;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/256/1/012006/pdf
DOI  :  10.1088/1757-899X/256/1/012006

来源: IOP

【 摘 要 】

We report on the experimental observation of the electrical oscillations in an oscillating loop connected to a contact of a conductive probe of an atomic force microscope to a tunnel-transparent (≈ 5 nm thick) SiO2/Si(001) film with embedded Au nanoparticles. The oscillations were attributed to the negative differential resistance of the probe-to-sample contact originating from the resonant electron tunnelling between the probe and the Si substrate via the quantum confined electron energy states in small (∼1 nm in size) Au nanoparticles. This observation demonstrates the prospects to build an oscillator nanoelectronic device based on an individual nanometer-sized metal nanoparticle.