Light absorption by an atomic force microscope probe

18th Russian Youth Conference on Physics of Semiconductors and Nanostructures, Opto- and Nanoelectronics

Sharov, V.A.^1 ; Dunaevskiy, M.S.^1,2 ; Kryzhanovskaya, N.V.^3 ; Polubavkina, Yu.S.^3 ; Alekseev, P.A.^1

Ioffe Institute, 26 Politekhnicheskaya str., St. Petersburg

194021, Russia^1

ITMO University, 49 Kronverksky pr., St. Petersburg

197101, Russia^2

Saint Petersburg National Research Academic University of RAS, 8 Khlopina str., St. Petersburg

194021, Russia^3

关键词: AFM probe;    Evanescent wave absorption;    Far field;    Flat surfaces;    Lateral resolution;    Optical radiations;    Probe tips;    Visible range;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/816/1/012036/pdf
DOI  :  10.1088/1742-6596/816/1/012036

来源: IOP

【 摘 要 】

In this paper a probe of an atomic force microscope (AFM) served as a detector of optical radiation. We investigated absorption of optical radiation in the visible range by commercially available Si and Si3N4probes. It has been shown that the radiation in the far field is mainly absorbed in the probe tip. By scanning a laser beam with a diameter of ∼ 0.7 microns by the AFM probe, a lateral resolution of ∼ 1.5 microns was demonstrated. Numerical modeling of evanescent wave absorption by AFM probes showed enhancement of the absorption in the probes as compared with a flat surface. A Si3N4probe more effectively absorbs the evanescent radiation.