In situ visualization of domain structure evolution during field cooling in 0.67PMN-0.33PT single crystal

Scanning Probe Microscopy 2017

Ushakov, A.D.^1 ; Esin, A.A.^1 ; Chezganov, D.S.^1 ; Turygin, A.P.^1 ; Akhmatkhanov, A.R.^1 ; Hu, Q.^1 ; Sun, L.^1 ; Wei, X.^2 ; Shur, V.Ya.^1

School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg

620000, Russia^1

Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education, International Center for Dielectric Research, Xi'An Jiaotong University, Xi'an

710049, China^2

关键词: Dielectric permittivities;    Domain evolution;    Domain structure;    High spatial resolution;    Piezoresponse force microscopy;    Polarized domain;    Relaxor ferroelectric;    Situ visualization;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/256/1/012025/pdf
DOI  :  10.1088/1757-899X/256/1/012025

来源: IOP

【 摘 要 】

The evolution of the domain structure during in-field cooling was in situ studied in [001]-cut single crystals of relaxor ferroelectric (1-x)Pb(Mg1/3Nb2/3)O3-xPbTiO3(PMN-PT) with x = 0.33 with maximum of dielectric permittivity at 150°C. The main stages of domain evolution have been separated. The visualization of the static as-grown and polarized domain structures with high spatial resolution by piezoresponse force microscopy and scanning electron microscopy allowed measuring the characteristic features of maze and needle-like domain structures.