Characterization of voids in shock-loaded Al single crystal by combining X-ray tomography and electron microscopy

38th Risø International Symposium on Materials Science

Hong, Chuanshi^1 ; Fæster, Soren^1 ; Hansen, Niels^1 ; Huang, Xiaoxu^1 ; Barabash, Rozaliya I.^2

Section for Materials Science and Advanced Characterization, Department of Wind Energy, Technical University of Denmark, Riso Campus, Roskilde

4000, Denmark^1

Materials Science and Technology Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge

TN

37830, United States^2

关键词: Crystallographic information;    Electron back scatter diffraction;    Regular patterns;    Shock loadings;    Three-dimensional information;    Void growth;    X-ray tomography;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/219/1/012027/pdf
DOI  :  10.1088/1757-899X/219/1/012027

来源: IOP

【 摘 要 】

A combination of X-ray tomography and electron backscatter diffraction (EBSD) was applied to investigate both the shape of voids and the plastic deformation around voids in an Al single crystal shock-loaded in thedirection. The combination of these two techniques allows the addition of crystallographic information to X-ray tomography and allows the addition of three-dimensional information to EBSD data. It is found that the voids are octahedral with {1 1 1} faces and that regular patterns of lattice reorientation exist around individual voids. The results provide new insights to the process of void growth during shock loading, which is important for both civil and military applications.