会议论文详细信息
1st International Telecommunication Conference "Advanced Micro- and Nanoelectronic Systems and Technologies" | |
Thin coatings and films hardness evaluation | |
无线电电子学 | |
Matyunin, V.M.^1 ; Marchenkov, A.Yu.^1 ; Demidov, A.N.^1 ; Karimbekov, M.A.^1 | |
Moscow Power Engineering Institute, Krasnokazarmennaya st. 14, Moscow | |
111250, Russia^1 | |
关键词: Coating-substrate; Composite hardness; Evaluation methods; Experimental verification; Hardness values; Scale Factor; Scale levels; Substrate hardness; | |
Others : https://iopscience.iop.org/article/10.1088/1757-899X/151/1/012030/pdf DOI : 10.1088/1757-899X/151/1/012030 |
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来源: IOP | |
【 摘 要 】
The existing thin coatings and films hardness evaluation methods based on indentation with pyramidal indenter on various scale levels are expounded. The impact of scale factor on hardness values is performed. The experimental verification of several existing hardness evaluation methods regarding the substrate hardness value and the "coating - substrate" composite hardness value is made.
【 预 览 】
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Thin coatings and films hardness evaluation | 728KB | download |