Nanotomography endstation at the P05 beamline: Status and perspectives

X-Ray Microscopy Conference 2016

Greving, I.^1 ; Ogurreck, M.^1,4 ; Marschall, F.^2 ; Last, A.^3 ; Wilde, F.^1 ; Dose, T.^1 ; Burmester, H.^1 ; Lottermoser, L.^1 ; Müller, M.^1 ; David, C.^2 ; Beckmann, F.^1

Helmholtz-Zentrum Geesthacht, Institute of Materials Research, Germany^1

Paul Scherrer Institut, Laboratory for Micro- and Nanotechnology, PSI, Switzerland^2

Karlsruhe Institute of Technology, Institute of Microstructure Technology, Germany^3

Diamond Light Source Ltd, Didcot, United Kingdom^4

关键词: Compound refractive lens;    Experimental requirements;    Fresnel zone plate;    High flexibility;    Imaging applications;    Kirkpatrick-Baez mirror;    Metallic material;    X ray microscopy;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/849/1/012056/pdf
DOI  :  10.1088/1742-6596/849/1/012056

来源: IOP

【 摘 要 】

The Imaging Beamline IBL/P05 at the DESY storage ring PETRA III, operated by the Helmholtz-Zentrum Geesthacht, has two dedicated endstations optimized for micro- and nanotomography experiments [1-3]. Here we present the status of the nanotomography endstation, highlight the latest instrumentation upgrades and present first experimental results. In particular in materials science, where structures with ceramics or metallic materials are of interest, X-ray energies of 15 keV and above are required even for sample sizes of several 10 μm in diameter. The P05 imaging beamline is dedicated to materials science and is designed to allow for imaging applications with X-ray energies of 10 to 50 keV. In addition to the full field X-ray microscopy setup, the layout of the nanotomography endstation allows switching to cone-beam configuration. Kinematics for X-ray optics like compound refractive lenses (CRLs), Fresnel zone plates (FZP) or beam-shaping optics are implemented and the installation of a Kirkpatrick Baez-mirror (KB mirror) system is foreseen at a later stage of the beamline development. Altogether this leads to a high flexibility of the nanotomography setup such that the instrument can be tailored to the specific experimental requirements of a range of sample systems.