Optimal focusing system of the Fresnel zone plates at the Synchrotron SOLEIL NanoARPES beamline

X-Ray Microscopy Conference 2016

Avila, José^1 ; Boury, Antoine^1 ; Caja-Munoz, Borja^1 ; Chen, Chaoyu^1 ; Lorcy, Stephane^1 ; Asensio, Maria C.^1

ANTARES Beamline, Synchrotron SOLEIL, Université Paris-Saclay, L'Orme des Merisiers, Saint Aubin-BP 48, Gif sur Yvette Cedex

91192, France^1

关键词: Advanced materials;    Angle resolved photoelectron spectroscopy;    Chemical imaging;    Focusing mirrors;    Fresnel zone plate;    Level detections;    Nano-positioning;    Spatial resolution;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/849/1/012039/pdf
DOI  :  10.1088/1742-6596/849/1/012039

来源: IOP

【 摘 要 】

ANTARES beamline (BL), operating at very low photon energies, is a new soft X-ray scanning microscope recently built at SOLEIL Synchrotron, that offers a spectroscopic non-destructive nano-probe to study advanced materials. It combines a set of Fresnel Zone Plates (FZP) able to focalize the beam spot up to a few tenths of nanometres with a stable and precise sample nanopositioning (