High-resolution Electronic and Chemical imaging of wonder nanomaterials beyond graphene

33rd International Conference on the Physics of Semiconductors

Avila, José^1 ; Chen, Chaoyu^1 ; Lorcy, Stephane^1 ; Asensio, Maria C.^1

ANTARES Beamline, Synchrotron SOLEIL, Université Paris-Saclay, L'Orme des Merisiers, Saint Aubin-BP 48, Gif sur Yvette Cedex

91192, France^1

关键词: Angle resolved photoelectron spectroscopy;    Chemical imaging;    Complex materials;    Electronic information;    High resolution;    Mono-crystals;    Precise determinations;    Reciprocal space;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/864/1/012036/pdf
DOI  :  10.1088/1742-6596/864/1/012036

来源: IOP

【 摘 要 】

Despite the great progress made recently in spectroscopic imagery and even the remarkable success achieved, the challenge still remain concerning the precise determination of the chemical and electronic imagery of advances materials, which usually are available as heterogeneous large crystals or tiny homogeneous monocrystals. Here we report, a recently developed novel X-ray microscope, labelled, k-microscope or Nano-ARPES (Nano Angle Resolved Photoelectron Spectroscopy) particularly well suited to provide both high resolved chemical and electronic information in the real and reciprocal space of complex materials with nano-scale resolution.