Separating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEM

Electron Microscopy and Analysis Group Conference 2015

Wan, Q.^1 ; Plenderleith, R.A.^1 ; Dapor, M.^3 ; Rimmer, S.^2 ; Claeyssens, F.^1 ; Rodenburg, C.^1

Department of Material Science and Engineering, University of Sheffield, Western Bank, Sheffield

S10 2TN, United Kingdom^1

Department of Chemistry, University of Sheffield, Western Bank, Sheffield

S10 2TN, United Kingdom^2

European Centre for Theoretical Studies in Nuclear Physics and Related Areas (ECT-FBK), Trento Institute for Fundamental Physics and Applications (TIFPA- INFN), via Sommarive 18, Trento

I-38123, Italy^3

关键词: Back-scattered;    Chemical information;    Linear relationships;    Low voltages;    Polymer composite;    Polymer nanocomposite;    SEM imaging;    Topographical information;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/644/1/012018/pdf
DOI  :  10.1088/1742-6596/644/1/012018

来源: IOP

【 摘 要 】

The possibility of separating the topographical and chemical information in a polymer nano-composite using low-voltage SEM imaging is demonstrated, when images are acquired with a Concentric Backscattered (CBS) detector. This separation of chemical and topographical information is based on the different angular distribution of electron scattering which were calculated using a Monte Carlo simulation. The simulation based on angular restricted detection was applied to a semi-branched PNIPAM/PEGDA interpenetration network for which a linear relationship of topography SEM contrast and feature height data was observed.