Dynamics of silver photo-diffusion into Ge-chalcogenide films: time-resolved neutron reflectometry

6th International Conference on Optical, Optoelectronic and Photonic Materials and Applications 2014

Sakaguchi, Y.^1 ; Asaoka, H.^2 ; Uozumi, Y.^2 ; Kawakita, Y.^2 ; Ito, T.^3 ; Kubota, M.^2 ; Yamazaki, D.^2 ; Soyama, K.^2 ; Ailavajhala, M.^3 ; Latif, M.R.^3 ; Wolf, K.^3 ; Mitkova, M.^3 ; Skoda, M.W.A.^3

Comprehensive Research Organization for Science and Society (CROSS), Ibaraki, Tokai, 319-1106, Japan^1

Japan Atomic Energy Agency, Ibaraki, Tokai, 319-1195, Japan^2

Boise State University, Boise

ID, United States^3

关键词: Chalcogenide films;    Homogeneous layers;    Linear detectors;    Neutron reflectivity;    Neutron reflectivity measurements;    Neutron reflectometry;    Off-specular scattering;    Total reflection;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/619/1/012046/pdf
DOI  :  10.1088/1742-6596/619/1/012046

来源: IOP

【 摘 要 】

Silver diffuses into an amorphous (a-) chalcogenide layer while visible light illuminates Ag/a-chalcogenide films and neutron reflectometry is a suitable technique probing time evolution of the depth profiles without damaging the sample by the probe beam itself. In this paper, we report the results of time-resolved neutron reflectivity measurements of a-Ge40Se60/Ag/ Si films taken while the films are exposed to visible light. From the measurements, we found enormous changes in the neutron reflectivity profile, including a loss of total reflection region, with continuous illumination even after forming one homogeneous layer, which occurred about 50 min after starting illumination. At this stage, a clear off-specular scattering was observed by a linear detector and a surface roughness was observed with naked eyes.