CMOS sensor as charged particles and ionizing radiation detector

7th International Congress of Engineering Physics

物理学;工业技术

Cruz-Zaragoza, E.^1 ; Piña López, I.^2

Unidad de Irradiación y Seguridad Radiológica, Instituto de Ciencias Nucleares, Universidad Nacional Autónoma de México, México D.F

A.P. 70-543, 04510, Mexico^1

Facultad de Ciencias, Universidad Nacional Autónoma de México, Circuito Exterior C.U., México D.F.

04510, Mexico^2

关键词: Charge particles;    CMOS sensors;    Exposed to;    Gamma photons;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/582/1/012047/pdf
DOI  :  10.1088/1742-6596/582/1/012047

学科分类：工业工程学

来源: IOP

【 摘 要 】

This paper reports results of CMOS sensor suitable for use as charged particles and ionizing radiation detector. The CMOS sensor with 640 × 480 pixels area has been integrated into an electronic circuit for detection of ionizing radiation and it was exposed to alpha particle (Am-241, Unat), beta (Sr-90), and gamma photons (Cs-137). Results show after long period of time (168 h) irradiation the sensor had not loss of functionality and also the energy of the charge particles and photons were very well obtained.