Aberration corrected environmental STEM (AC ESTEM) for dynamic in-situ gas reaction studies of nanoparticle catalysts

Electron Microscopy and Analysis Group Conference 2013

Boyes, E.D.^1,2,3 ; Gai, P.L.^1,2,4

York JEOL Nanocentre, University of York, YO10 5DD York, United Kingdom^1

Department of Physics, University of York, YO10 5DD York, United Kingdom^2

Department of Electronics, University of York, YO10 5DD York, United Kingdom^3

Department of Chemistry, University of York, YO10 5DD York, United Kingdom^4

关键词: Aberration correction;    Aberration-corrected;    Controlled conditions;    Environmental emissions;    Environmental scanning;    Heterogeneous nanoparticles;    Nanoparticle catalysts;    Pharmaceutical products;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/522/1/012004/pdf
DOI  :  10.1088/1742-6596/522/1/012004

来源: IOP

【 摘 要 】

Environmental scanning transmission electron microscopy (ESTEM) with aberration correction (AC) has recently been added to the capabilities of the more established ETEM for analysis of heterogeneous nanoparticle based catalysts. It has helped to reveal the importance and potentially unique properties of individual atoms as active sites in their own right as well as pathways between established nanoparticles. A new capability is introduced for dynamic in-situ experiments under controlled conditions of specimen temperature and gas environment related to real world conditions pertinent to a range of industrial and societal priorities for new and improved chemical processes, materials, fuels, pharmaceutical products and processes, and in control or remediation of environmental emissions.