The new principle for intensity calculation of X-rays dynamically diffracted in single crystals with defects

RREPS13; Meghri13

Yeghiazaryan, A.M.^1 ; Gevorgyan, K.M.^1 ; Atanesyan, A.K.^1

Institute of Applied Problems of Physics of NAS, 25 Hr.Nersisyan str., Yerevan, RA 0014, Armenia^1

关键词: Bragg diffraction;    Dynamic theory;    Integral-differential equations;    Particular solution;    Scattered X-rays;    Small angle scattering;    X ray intensity;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/517/1/012032/pdf
DOI  :  10.1088/1742-6596/517/1/012032

来源: IOP

【 摘 要 】

A new principle is introduced for X-ray intensity calculation dynamically scattered in single crystals with defects. The principle is based on Bragg diffraction dynamic theory for X-rays in ideal single crystals and small angle scattering theory. The principle is substantiated by juxtaposition of the corresponding formula with the particular solution of the integral-differential equation for a dynamically scattered X-ray wave in a weakly distorted single crystal.