Scanning CCD Detector for X-ray Powder Diffraction

17th Pan-American Synchrotron Radiation Instrumentation Conference

Madden, T.^1 ; Baldwin, J.^1 ; Von Dreele, R.^1 ; Suchomel, M.^1 ; Toby, B.H.^1

Advanced Photon Source, Argonne National Laboratory, 9700 S. Cass Ave., Argonne, IL 60439, United States^1

关键词: Amorphous silicon flat-panel;    Continuous motions;    High resolution;    High sensitivity;    Linear positions;    Position-Sensitive Detectors;    Powder diffraction;    Rapid measurement;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/493/1/012016/pdf
DOI  :  10.1088/1742-6596/493/1/012016

来源: IOP

【 摘 要 】

We discuss the design, fabrication and use of a custom CCD detector for x-ray powder diffraction measurements. The detector is mounted on a diffractometer arm, where line-by-line readout of the CCD is coupled to continuous motion of the arm. As the arm moves, the data from the CCD detector are accumulated and can be viewed as if it were a film strip with partial powder diffraction rings. Because of the unique design of the camera, both high-resolution and rapid measurements can be performed. Powder diffraction patterns are collected with speeds of a few minutes, or less, with many of the advantages of large area position-sensitive detectors, for example amorphous silicon flat panels, such as high sensitivity, direct evidence of grainy samples and freedom from low-angle asymmetry, but with resolution better than linear position-sensitive detectors and nearly as good as the ultimate in resolution, analyser-crystal detection [2,3].