Method for Building Health Index of Darlington Transistor Based on KPCA and Mahalanobis Distance

2nd International Symposium on Resource Exploration and Environmental Science

生态环境科学

Liu, Qiang^1 ; Cheng, Jinjun^1 ; Tan, Yangbo^1 ; Guo, Wenhao^1 ; Wang, Ruoan^1

College of Aerospace Engineering, Air Force Engineering University, Xian

710038, China^1

关键词: Accelerated degradation testing (ADT);    Collector currents;    Darlington transistor;    Data processing methods;    Interference signal;    Mahalanobis distances;    Prediction accuracy;    Wavelet Packet Decomposition;   

Others  :  https://iopscience.iop.org/article/10.1088/1755-1315/170/4/042135/pdf
DOI  :  10.1088/1755-1315/170/4/042135

学科分类：环境科学（综合）

来源: IOP

【 摘 要 】

In order to obtain characteristic parameters which can describe the healthy status of Darlington transistor, a method for building Health Index (HI) based on KPCA and Mahalanobis distance was proposed. Through the failure mechanism analysis and Accelerated Degradation Testing (ADT) of Darlington transistor, the degradation data of collector current and saturation voltage were obtained. For the degradation data has obvious nonlinear features and some noise which are unfavorable for failure analysis, a data processing method was put forward by using wavelet packet decomposition and Kernel Component Analysis (KPCA). The interference signal was filtered and the main components were obtained. By using this method. Finally, the Mahalanobis distance was used to fuse these components into Health Index. And the Health Index could represent how the healthy status of Darlington transistor changes. Through multiple sets of data verification, the Health Index used Mahalanobis distance showed higher prediction accuracy than the Euclidean distance with the same fault predict algorithm.