Nonparametric algorithm of electronic components test data pattern recognition

International Workshop "Advanced Technologies in Material Science, Mechanical and Automation Engineering – MIP: Engineering – 2019"

材料科学;机械制造;原子能学

Koplyarova, N.V.^1 ; Chzhan, E.A.^1 ; Medvedev, A.V.^1 ; Korneeva, A.A.^1 ; Raskina, A.V.^1 ; Kukartsev, V.V.^1^2 ; Tynchenko, V.S.^1^2

Siberian Federal University, Svobodny pr. 79, Krasnoyarsk

660041, Russia^1

Siberian State University of Science and Technology, Krasnoyarskiy Rabochiy Ave. 31, Krasnoyarsk

660037, Russia^2

关键词: Electronic component;    Non destructive testing;    Non-parametric algorithm;    Number of class;    Preliminary information;    Test data;    Training sample;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/537/4/042021/pdf
DOI  :  10.1088/1757-899X/537/4/042021

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

The paper discusses the quality diagnostics of electrical radio components based on the results of non-destructive testing. A proposed clustering algorithm does not require preliminary information on the number of classes and the training sample. The algorithm allows to automatically determine the number of classes. The division into classes is due to the different characteristics of the measured variables, which correspond to different product quality ranges.