Recursive clustering algorithm based on silhouette criterion maximization for sorting semiconductor devices by homogeneous batches

International Workshop "Advanced Technologies in Material Science, Mechanical and Automation Engineering – MIP: Engineering – 2019"

材料科学;机械制造;原子能学

Golovanov, S.M.^1 ; Orlov, V.I.^1 ; Kazakovtsev, L.A.^1^2 ; Popov, A.M.^1

Reshetnev Siberian State University of Science and Technology, 31, Krasnoyarskiy Rabochiy av., Krasnoyarsk

660037, Russia^1

Krasnoyarsk State Agrarian University, 90, Mira av., Krasnoyarsk

660049, Russia^2

关键词: Homogeneous group;    K-means;    Mixed productions;    Non destructive testing;    Production batches;    Recursive algorithms;    Space industry;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/537/2/022035/pdf
DOI  :  10.1088/1757-899X/537/2/022035

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

We propose a recursive algorithm for dividing a presumably mixed production batch of semiconductor devices into homogeneous groups (clusters) with the use of data of non-destructive testing, based on the maximization of the silhouette criterion in the sequential solving of the k-Means clustering problems. Based on the silhouette criterion, we formulate the concept of homogeneity of a production batch. The application of the developed algorithm to the problem of formation of homogeneous production batches of integrated circuits for space industry is illustrated with a computational example.