Estimation of the impact of semiconductor device parameters on the accuracy of separating a mixed production batch

International Workshop "Advanced Technologies in Material Science, Mechanical and Automation Engineering – MIP: Engineering – 2019"

材料科学;机械制造;原子能学

Shkaberina, G. Sh.^1 ; Orlov, V.I.^1^2 ; Tovbis, E.M.^1 ; Sugak, E.V.^1 ; Kazakovtsev, L.A.^1^3

Reshetnev Siberian State University of Science and Technology, Krasnoyarskiy Rabochiy av. 31, Krasnoyarsk

660037, Russia^1

Testing and Technical Center - NPO PM, Molodezhnaya St 20, Zheleznogorsk

662970, Russia^2

Siberian Federal University, Svobodny av. 79, Krasnoyarsk

660041, Russia^3

关键词: Clustering accuracy;    Factor structure;    Measured parameters;    Mixed productions;    Orthogonal rotations;    Production batches;    Space industry;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/537/3/032088/pdf
DOI  :  10.1088/1757-899X/537/3/032088

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

In this paper, we investigate the problem of separation of a mixed production batch of semiconductor devices for the space industry into homogeneous production batches. The method of factor analysis is applied to reduce the dimensionality of the problem. We investigate the impact of measured parameters of semiconductor devices in the accuracy of the separation of the mixed lot, composed several homogeneous batches. It was shown, that with any orthogonal rotations of factor structure as the number of homogeneous batches in the sample increases, the clustering accuracy reduces. Groups of semiconductor device parameters which have the greatest impact on the partition accuracy regardless of the number of homogeneous batches in the sample detected.