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1 Temperature dependent DC characterization of InAlN/(AlN)/GaN HEMT for improved reliability [会议论文]

作者:Takhar, K.^1;Gomes, U.P.^1;Ranjan, K.^1;等

关键词:DC characterization;Density of state;...

会议举办机构:Advanced Technology Development Center, Indian Institute of Technology Kharagpur, Kharagpur, West Bengal

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