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  • × Reshetnev Siberian State University of Science and Technology, Krasnoyarskiy Rabochiy av. 31, Krasnoyarsk
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1 Estimation of the impact of semiconductor device parameters on the accuracy of separating a mixed production batch [会议论文]

作者:Shkaberina, G. Sh.^1;Orlov, V.I.^1^2;Tovbis, E.M.^1;等

关键词:Clustering accuracy;Factor structure;...

会议举办机构:Reshetnev Siberian State University of Science and Technology, Krasnoyarskiy Rabochiy av. 31, Krasnoyarsk

会议时间:2019

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