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  • × International Workshop "Advanced Technologies in Material Science, Mechanical and Automation Engineering – MIP: Engineering – 2019
  • × Automated testing
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1 Automated testing and fault diagnosis of the microcontroller system [会议论文]

作者:Pankov, D.A.^1, Denisova, L.A.^1

关键词:Automated testing;Device failures;...

会议举办机构:Omsk State Technical University, 11, Pr. Mira, Omsk

会议时间:2019

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