Automated testing and fault diagnosis of the microcontroller system

International Workshop "Advanced Technologies in Material Science, Mechanical and Automation Engineering – MIP: Engineering – 2019"

材料科学;机械制造;原子能学

Pankov, D.A.^1 ; Denisova, L.A.^1

Omsk State Technical University, 11, Pr. Mira, Omsk

644050, Russia^1

关键词: Automated testing;    Device failures;    Intermittent failure;    Microcontroller devices;    Microcontroller systems;    Software and hardwares;    System architectures;    Testing systems;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/537/2/022072/pdf
DOI  :  10.1088/1757-899X/537/2/022072

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

The article deals with the problem systems automated testing of microcontrollers. A system architecture proposed for fault diagnosis and determining the consequences of device failures. Highlighted separately intermittent failure. The issue of integrating software and hardware failure simulation tools into the testing architecture investigated. Model studies of the testing system performed and conducted diagnostics of simulated faults. The efficiency technology of automated testing confirmed with simulation known failures types (injection) for the components of the performed microcontroller device is proposed.