High Resolution Electron Beam Testing of Gallium Nitride Based Light Emitting Diodes

GaN;MQW LEDs;STEM;EBIC;CL;V-defects

Progl, Curtis Lorenz ; Phillip E. Russell, Committee Chair,Gerd J. Duscher, Committee Member,Mark A. Johnson, Committee Member,Carl M. Osburn, Committee Member,Progl, Curtis Lorenz ; Phillip E. Russell ; Committee Chair ; Gerd J. Duscher ; Committee Member ; Mark A. Johnson ; Committee Member ; Carl M. Osburn ; Committee Member

University:North Carolina State University

关键词: GaN;    MQW LEDs;    STEM;    EBIC;    CL;    V-defects;   

Others  :  https://repository.lib.ncsu.edu/bitstream/handle/1840.16/4454/etd.pdf?sequence=1&isAllowed=y

美国|英语

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