Defect and Impurity Distributions in Traditionally Cast Multicrystalline and Cast Monocrystalline Silicon for Solar Substrates

MW-PCD;impurities;DLTS;crystal defects;FT-IR;monocrystalline cast silicon;defect delineation etching;SIMS;solar silicon;Mono2;multicrystalline cast silicon

Witting, Ian Thomas ; Gerd Duscher, Committee Member,Carlton Osburn, Committee Member,George Rozgonyi, Committee Chair,Witting, Ian Thomas ; Gerd Duscher ; Committee Member ; Carlton Osburn ; Committee Member ; George Rozgonyi ; Committee Chair

University:North Carolina State University

关键词: MW-PCD;    impurities;    DLTS;    crystal defects;    FT-IR;    monocrystalline cast silicon;    defect delineation etching;    SIMS;    solar silicon;    Mono2;    multicrystalline cast silicon;   

Others  :  https://repository.lib.ncsu.edu/bitstream/handle/1840.16/1370/etd.pdf?sequence=1&isAllowed=y

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