Thermomechanical sensitivity of microcantilever in the mid-infrared spectral region

Bimaterial;Microcantilevers;infrared;thermomechanical;photothermal;FT-IR microscopy;monochromator;modeling

Kwon, Beomjin ; King, William P. ; King ; William P.

关键词: Bimaterial;    Microcantilevers;    infrared;    thermomechanical;    photothermal;    FT-IR microscopy;    monochromator;    modeling;   

Others  :  https://www.ideals.illinois.edu/bitstream/handle/2142/14659/2_Kwon_Beomjin.pdf?sequence=6&isAllowed=y

美国|英语

来源: The Illinois Digital Environment for Access to Learning and Scholarship

【 摘 要 】

This paper reports the thermomechanical sensitivity of bimaterial cantilevers over a mid-infrared (IR) spectral range (5-10 µm) that is critical both for chemical analysis via vibrational spectroscopy and for direct thermal detection in the 300-700 K range. Mechanical bending sensitivity and noise were measured and modeled for six commercially available microcantilevers, which consist of either an aluminum film on a silicon cantilever or a gold film on a silicon nitride cantilever. The spectral sensitivity of each cantilever was determined by recording cantilever deflection when illuminated with IR light from a monochromator. Rigorous modeling and systematic characterization of the optical system allowed for a quantitative estimate of IR energy incident upon the cantilever. Separately, spectral absorptance of the cantilever was measured using Fourier transform infrared (FT-IR) microscopy, which was compared with analytical models of radiation onto the cantilever and heat flow within the cantilever. The predictions of microcantilever thermomechanical bending sensitivity and noise agree well with measurements, resulting in a ranking of these cantilevers for their potential use in IR measurements.