Investigating soft failures induced by system-level ESD

ESD;Soft Failures;System-Level ESD;IEC 61000-4-2;Soft Failure

Vora, Sandeep Gautam ; Rosenbaum ; Elyse

关键词: ESD;    Soft Failures;    System-Level ESD;    IEC 61000-4-2;    Soft Failure;   

Others  :  https://www.ideals.illinois.edu/bitstream/handle/2142/102509/VORA-THESIS-2018.pdf?sequence=1&isAllowed=y

美国|英语

来源: The Illinois Digital Environment for Access to Learning and Scholarship

【 摘 要 】

Hardware and application-level manifestations of ESD soft failures were characterized for three single-board computers. ESD events were generated following the system-level ESD standard (IEC 61000-4-2), matching real-world testing and events. Soft failures resulting from ESD were seen on all products tested. Failures associated with the peripheral ICs occur independently of the application being run; the application-dependent failures are attributed to noise at the CPU.