This thesis concentrates on coherent transition and diffraction from short electron bunches as a potential high intensity far-infrared radiation source and for sub-picosecond electron bunch length measurements. Coherent transition radiation generated from a 25 MeV beam at a vacuum-metal interface is characterized. Such a high intensity radiation source allows far-infrared spectroscopy to be conducted conveniently with a Michelson interferometer and a room temperature detector. Measurements of the refractive index of silicon are described to demonstrate the possibilities of far-infrared spectroscopy using coherent transition radiation. Coherent diffraction radiation, which is closely related to coherent transition radiation, can be considered as another potential FIR radiation source. Since the perturbation by the radiation generation to the electron beam is relatively small, its has the advantage of being a nondestructive radiation source.