科技报告详细信息
| Limitations on the Use of Scanning Probe Microscopy for the Measurement of Field Emission from Cooper Surfaces. | |
| Mizuno, Y. ; Kirby, R. E. | |
| Technical Information Center Oak Ridge Tennessee | |
| 关键词: Copper; Electric fields; Electron emission; Field emission; Linear colliders; | |
| RP-ID : DE2004826839 | |
| 学科分类：工程和技术（综合） | |
| 美国|英语 | |
| 来源: National Technical Reports Library | |
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【 摘 要 】
No abstract available.
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| DE2004826839.pdf | 2177KB |  download |
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