Development of a High Resolution Imaging Spectrometer. Final Technical Report for Period September 4, 1999-March 4, 2000.

Krieger, A. S. ; Parsignault, D. R.

Technical Information Center Oak Ridge Tennessee

关键词: Crystal structure;    Images;    Spectrometers;    Spatial resolution;    Progress report;   

RP-ID  :  DE2001769203

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

In this program we demonstrated that a quartz crystal could be bent to a spherical shape around a convex form, thereby eliminating the problems of deviations in the flatness of the crystal, non-uniformities in crystal thickness, and variations in the thickness of the epoxy bonding the crystal to its support form. Optical testing showed that the front surface of the crystal was spherical with an RMS deviation of 1/20 of a wave. X-ray testing showed that the resolving power of this crystal was on the order of 10(sup 4). We developed a design concept for a spherical crystal spectrometer for use at NSTX and established that it could be built at a cost within the parameters of phase II.