科技报告详细信息
Effect of Thermal Annealing and Second Harmonic Generation on Bulk Damage Performance of Rapid-Growth KDP Type I Doublers at 1064 nm. | |
Runkel, M. ; Maricle, S. ; Torres, R. ; Auerbach, J. ; Floyd, R. ; Hawley-Fedder, R. ; Burnham, A. K. | |
Technical Information Center Oak Ridge Tennessee | |
关键词: Annealing; Harmonic generation; Damage; Performance evaluation; Crystals; | |
RP-ID : DE200515013174 | |
学科分类:工程和技术(综合) | |
美国|英语 | |
来源: National Technical Reports Library | |
【 摘 要 】
This paper discusses the results of thermal annealing and in-situ second harmonic generation (SHG) damage tests performed on six rapid growth KDP type 1 doubler crystals at 1064 nm on the Zeus automated damage test facility. Unconditioned (S/1) and conditioned (R/l) damage probability tests were performed before and after thermal annealing, then with and without SHG on six doubler crystals from the NIF-size, rapid growth KDP boule F6.
【 预 览 】
Files | Size | Format | View |
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DE200515013174.pdf | 648KB | download |