Testing of the TriP Chip Running at 132 nsec Using a Modified AFE Board.

Estrade, J. ; Garcia, C. ; Hoeneisenn, B. ; Rubinov, P.

Technical Information Center Oak Ridge Tennessee

关键词: Analog systems;    Coupling;    Discriminators;    Readout systems;    Substrates;   

RP-ID  :  DE2004820409

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

In this note we describe the first set of tests done with a sample of TriP chips that were mounted on a modified AFE board. The modifications consisted of different firmware and the replacement of one power supply switch. The board used was a standard AFEIc board (red type) on which new MCMs (MCMIIs) were mounted. The new MCMs were designed to support the TriP and emulate the SVX for readout when mounted on an AFEIc board. The TriP and the MCMs are described.