Flat-Field Calibration of CCD Detector for Long Trace Profilers.

Kirschman, J. L. ; Yashchuk, V. V. ; Smith, B. B. ; Warwick, T. ; Irick, S. C.

Technical Information Center Oak Ridge Tennessee

关键词: Charge-coupled devices;    Detectors;    Calibration;    Synchrotrons;    Free electron lasers;   

RP-ID  :  DE2008926895

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

The next generation of synchrotrons and free electron lasers requires x-ray optical systems with extremely high-performance, generally, of diffraction limited quality. Fabrication and use of such optics requires highly accurate metrology. In the present paper, we discuss a way to improve the performance of the Long Trace Profiler (LTP), a slope measuring instrument widely used at synchrotron facilities to characterize x-ray optics at high-spatial-wavelengths from approximately 2 mm to 1 m. One of the major sources of LTP systematic error is the detector. For optimal functionality, the detector has to possess the smallest possible pixel size/spacing, a fast method of shuttering, and minimal non-uniformity of pixel-to-pixel photo response. While the first two requirements are determined by choice of detector, the non-uniformity of photo response of typical detectors such as CCD cameras is around 2-3 percent. We describe a flat-field calibration set up specially developed for calibration of CCD camera photo-response and dark current with an accuracy of better than 0.5 percent. Such accuracy is adequate for use of a camera as a detector for an LTP with performance of approximately 0.1 microradian (rms).