Multi-Element Si Sensor with Readout Asic for EXAFS Spectroscopy.

De Geonimo, G. ; O'Conner, P. ; Beuttenmuller, R. H. ; Li, Z. ; Kuczewski, A. J. ; Siddons, D. P.

Technical Information Center Oak Ridge Tennessee

关键词: Sensors;    X-ray spectroscopy;    Absorption spectroscopy;    Bond angle;    Chemical bonds;   

RP-ID  :  DE2003807518

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

Extended X-ray Absorption Fine Structure (EXAFS) experiments impose stringent requirements on a detection system, due to the need for processing ionizing events at a high rate, typically above of 10Mcps/cm2, and with a high resolution, typically better than 300eV. The detection system here presented is being developed targeting these stringent requirements. It is the result of a cooperation between the Instrumentation Division and the National Synchrotron Light Source (NSLS) of the Brookhaven National Laboratoiy (BNL). The system is composed of a multi-element Si sensor with dedicated per pixel electronics. The combination of high rate, high resolution and moderate complexity makes this system attractive when compared to other multi-element solutions. In sections 2, 3 and 4 the sensor, the interconnect and the electronics are briefly described. Section 5 reports on the first experimental results.