X-Ray Raman Spectroscopy of High-Pressure Phases and Novel Materials Derived from Low-Z Compounds.

Evans, W. J. ; Eng, P. J. ; Maddox, B. ; Newville, M. ; Baer, B. ; Cynn, H. ; Lipp, M. J.

Technical Information Center Oak Ridge Tennessee

关键词: Spectroscopy;    X-ray spectroscopy;    Raman spectroscopy;    K edges;    Schematic diagrams;   

RP-ID  :  DE200515014346

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

We have used X-ray Raman spectroscopy (XRS) to study the oxygen and carbon K-edges of high pressure phases of carbon oxide and carbon dioxide to understand changes in chemical bonding associated with the pressure-induced molecular-to-nonmolecular phase transitions in these materials. This work has exploit the power of the XRS technique to resolve important scientific questions regarding the nature of the high-pressure phases of carbon oxide and carbon dioxide.