EBIT in the Magnetic Trapping Mode: Mass Spectrometry, Atomic Lifetime Measurements, and Charge Transfer Reactions of Highly Charged Atomic Ions.

Schweikhard, L. ; Beiersdorfer, P. ; Trabert, E.

Technical Information Center Oak Ridge Tennessee

关键词: Atomic ions;    Charged particles;    Confinement;    Mass spectrometry;    Lifetime;   

RP-ID  :  DE200415006512

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

Although it may sound like a contradiction in terms, the electron beam ion trap (EBIT) works as an ion trap even when the electron beam is switched off. We present various experiments that exploit the 'magnetic trapping mode' for investigations of ion confinement, charge exchange processes, atomic lifetime and ion mass measurements.