Electron Beam Lifetime in Spear3: Measurement and Simulation.

Corbett, J. ; Huang, X. ; Lee, M. ; Lui, P.

Technical Information Center Oak Ridge Tennessee

关键词: Electron beams;    Lifetime;    Rf systems;    Beam bunching;    Electric potential;   

RP-ID  :  DE2008921286

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

In this paper we report on electron beam lifetime measurements as a function of scraper position, RF voltage and bunch fill pattern in SPEAR3. We then outline development of an empirical, macroscopic model using the beam-loss rate equation. By identifying the dependence of loss coefficients on accelerator and beam parameters, a numerically-integrating simulator can be constructed to compute beam decay with time. In a companion paper, the simulator is used to train a parametric, non-linear dynamics model for the system.