Diagnostic Concept for High-Resolution Temporal Profile Measurements.

Andonian, G. ; Hemsing, E. ; Musumeci, P. ; O Shea, F. ; Rosenzweig, J. ; Murokh, A. ; Xiang, D. ; Pogorelski, I. ; Yakimenko, V.

Technical Information Center Oak Ridge Tennessee

关键词: Beam profiles;    Accelerators;    Brightness;    Diagnosis;    Electron beams;   

RP-ID  :  DE141149348

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

The diagnosis of the temporal profile and length of high brightness electron beams is very important in advanced accelerator facilities and next generation light sources. A novel diagnostic scheme to reach temporal resolutions exceeding 1 femtosecond has been studied recently (1). The scheme entails imposing an angular modulation on the electron beam by interaction with a high power laser in an undulator field. A subsequent deflection in the orthogonal dimension, provided by an RF cavity, generates a streak on a downstream screen. The observable pattern is now correlated to the beam longitudinal profile. In this paper, we present a test case for this scheme using the parameters of the Brookhaven National Laboratory Accelerator Test Facility (BNL ATF). The components of the proof-of principle experiment are presented.