Deep Level Transient Spectroscopy and Capacitance-Volyage Measurements of Cu(In,Ga)Se(2).

Abushama, J. ; Johnston, S. ; Ahrenkiel, R. ; Noufi, R.

Technical Information Center Oak Ridge Tennessee

关键词: Solar cells;    Thin films;    Spectroscopy;    Electronic properties;    Photovoltaic cells;   

RP-ID  :  DE200215000995

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

This conference paper describes the electronic properties of ZnO/CdS/Cu(In,Ga)Se2 (CIGS)/Mo/SLG polycrystalline thin-film solar cells with compositions ranging from Cu-rich to In-rich were investigated by deep level transient spectroscopy and capacitance-voltage (C-V) measurements. This compositional change represents the evolution of the film during growth by the three-stage process. Four thin-film CIGS samples with different Cu content were obtained. The Cu/(In+Ga) ratio ranges from 1.24 (Cu-rich)to 0.88 (In-rich), whereas the Ga/(In+Ga) ratio ranges from 0.19 (Cu-rich)to 0.28 (In-rich).The Cu-rich sample exhibits a shallow majority-carrier trap with an activation energy of 0.12 eV and another deeper trap with an activation energy of 0.28 eV, whereas the In-rich sample has a shallow minority-carrier trap with an activation energy of 0.12 eV. The two samples show evidence of a deeper trap at higher temperature. C-V measurements showed that the average carrier concentration (N values) around the junction of the cell changed as the film transitions from Cu-rich to In-rich. DLTS shows that acceptor-like traps are dominant in samples where CIGS grains did not go through the Cu-rich to In(Ga)-rich transition. While donor-like traps are dominant in the In(Ga)-rich samples.