Resolution Quality and Atom Positions in Sub-Angstrom Electron Microscopy.

O'Keefe, M. ; Allard, L. F. ; Blom, D. A.

Technical Information Center Oak Ridge Tennessee

关键词: Material science;    Electron microscopy;    Atoms;    Conferences;    Rayleigh-Sparrow criteria;   

RP-ID  :  DE2005842050

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

Ability to determine whether an image peak represents one single atom or several depends on resolution of the HR-(S)TEM. Rayleigh's resolution criterion, an accepted standard in optics, was derived as a means for judging when two image intensity peaks from two sources of light (stars) are distinguishable from a single source. Atom spacings closer than the Rayleigh limit have been resolved in HR-TEM, suggesting that it may be useful to consider other limits, such as the Sparrow resolution criterion