科技报告详细信息
Resolution Quality and Atom Positions in Sub-Angstrom Electron Microscopy. | |
O'Keefe, M. ; Allard, L. F. ; Blom, D. A. | |
Technical Information Center Oak Ridge Tennessee | |
关键词: Material science; Electron microscopy; Atoms; Conferences; Rayleigh-Sparrow criteria; | |
RP-ID : DE2005842050 | |
学科分类:工程和技术(综合) | |
美国|英语 | |
来源: National Technical Reports Library | |
【 摘 要 】
Ability to determine whether an image peak represents one single atom or several depends on resolution of the HR-(S)TEM. Rayleigh's resolution criterion, an accepted standard in optics, was derived as a means for judging when two image intensity peaks from two sources of light (stars) are distinguishable from a single source. Atom spacings closer than the Rayleigh limit have been resolved in HR-TEM, suggesting that it may be useful to consider other limits, such as the Sparrow resolution criterion
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