Synchrotron X-Ray Study of Multilayers in Laue Geometry.

Kang, H. C. ; Stephenson, G. B. ; Liu, C. ; Conley, R. ; Macrander, A. T. ; Maser, J. ; Bajt, S. ; Chapman, H. N.

Technical Information Center Oak Ridge Tennessee

关键词: Synchrotrons;    X ray diffraction;    Laue method;    Multilayers;    Optics;   

RP-ID  :  DE200515014490

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

Zone plates with depth to zone-width ratios as large as 100 are needed for focusing of hard x-rays. Such high aspect ratios are challenging to produce by lithography. We are investigating the fabrication of high-aspect-ratio linear zone plates by multilayer deposition followed by sectioning. As an initial step in this work, we present a synchrotron x-ray study of constant-period multilayers diffracting in Laue (transmission) geometry. Data are presented from two samples: a 200 period W/Si multilayer with d-spacing of 29 nm, and a 2020 period Mo/Si multilayer with d-spacing. By cutting and polishing we have successfully produced thin cross sections with section depths ranging from 2 to 12 mm. Transverse scattering profiles (rocking curves) across the Bragg reflection exhibit well-defined interference fringes originating from the depth of the sample, in agreement with dynamical diffraction theory for a multilayer in Laue geometry.