科技报告详细信息
Statistical Process Control (SPC) for Coordinate Measurement Machines. Using SPC and Monitoring of Standard Artifacts to Determine and Control Measurement Uncertainty in a Controlled Environment.
Escher, R. N.
Technical Information Center Oak Ridge Tennessee
关键词: Calibration;    Uncertainty;    Monitoring;    Measuring methods;    Statistical process control;   
RP-ID  :  DE2002752113
学科分类:工程和技术(综合)
美国|英语
来源: National Technical Reports Library
PDF
【 摘 要 】

The application of process capability analysis, using designed experiments, and gage capability studies as they apply to coordinate measurement machine (CMM) uncertainty analysis and control will be demonstrated. The use of control standards in designed experiments, and the use of range charts and moving range charts to separate measurement error into it's discrete components will be discussed. The method used to monitor and analyze the components of repeatability and reproducibility will be presented with specific emphasis on how to use control charts to determine and monitor CMM performance and capability, and stay within your uncertainty assumptions.

【 预 览 】
附件列表
Files Size Format View
DE2002752113.pdf 116KB PDF download
  文献评价指标  
  下载次数:8次 浏览次数:11次