科技报告详细信息
| Light-Biasing Electron-Beam-Induced-Current Measurements for Multijunction Solar Cells: Preprint. | |
| Romero, M. J. ; Olson, J. M. ; el-Jassim, M. M. | |
| Technical Information Center Oak Ridge Tennessee | |
| 关键词: Meetings; Solar cells; Current limiters; Photovoltaics; Measurements; | |
| RP-ID : DE200215000042 | |
| 学科分类：工程和技术（综合） | |
| 美国|英语 | |
| 来源: National Technical Reports Library | |
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【 摘 要 】
Presented at the 2001 NCPV Program Review Meeting: Results using light-biasing EBIC are illustrated for dual-junction InGaP/InGaAs solar cells.
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| DE200215000042.pdf | 480KB |  download |
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