科技报告详细信息
| High-Resolution AES Mapping and TEM Study of Cu(In,Ga)Se2 Thin Film Growth: Preprint. | |
| Perkins, C. L. | |
| Technical Information Center Oak Ridge Tennessee | |
| 关键词: Meetings; Auger electron spectroscopy; Transition electron microscopy; Thin films; Solar cells; | |
| RP-ID : DE200215000026 | |
| 学科分类：工程和技术（综合） | |
| 美国|英语 | |
| 来源: National Technical Reports Library | |
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【 摘 要 】
Presented at 2001 NCPV Program Review Meeting: TEM and high-resolution AES mapping data on CIGS samples.
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| DE200215000026.pdf | 334KB |  download |
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