Nondestructive Characterization of Atomic Density Profile in CdS/Zn2SnO4 Junctions by X-Ray Fluoresence: Preprint.

Kim, S. ; Soo, Y. L. ; Kioseoglou, G. ; Kao, Y. H. ; Wu, X.

Technical Information Center Oak Ridge Tennessee

关键词: Meetings;    X-ray flourescence;    Annealing;    Junctions;    Heat treatment;   

RP-ID  :  DE200215000037

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

Presented at the 2001 NCPV Program Review Meeting: Atomic density profile of selected atomic species in series of CdS/Zn2SnO4 junctions were studied by ADXRF.