科技报告详细信息
Nondestructive Characterization of Atomic Density Profile in CdS/Zn2SnO4 Junctions by X-Ray Fluoresence: Preprint.
Kim, S. ; Soo, Y. L. ; Kioseoglou, G. ; Kao, Y. H. ; Wu, X.
Technical Information Center Oak Ridge Tennessee
关键词: Meetings;    X-ray flourescence;    Annealing;    Junctions;    Heat treatment;   
RP-ID  :  DE200215000037
Subject:71.1
美国|英语
来源: National Technical Reports Library
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【 摘 要 】
Presented at the 2001 NCPV Program Review Meeting: Atomic density profile of selected atomic species in series of CdS/Zn2SnO4 junctions were studied by ADXRF.
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