|Nondestructive Characterization of Atomic Density Profile in CdS/Zn2SnO4 Junctions by X-Ray Fluoresence: Preprint.|
|Kim, S. ; Soo, Y. L. ; Kioseoglou, G. ; Kao, Y. H. ; Wu, X.|
|Technical Information Center Oak Ridge Tennessee|
|关键词: Meetings; X-ray flourescence; Annealing; Junctions; Heat treatment;|
|RP-ID : DE200215000037|
|来源: National Technical Reports Library|
【 摘 要 】Presented at the 2001 NCPV Program Review Meeting: Atomic density profile of selected atomic species in series of CdS/Zn2SnO4 junctions were studied by ADXRF.
【 预 览 】