Analysis of Nitrogen Incorporation in Group III-Nitride-Arsenide Materials Using a Magnetic Sector Secondary-Ion Mass Spectrometry (SIMS) Instrument: Preprint.

Reedy, R. C.

Technical Information Center Oak Ridge Tennessee

关键词: Meetings;    Nitrogen;    Solar cells;    Alloys;    Mass spectroscopy;   

RP-ID  :  DE200215000027

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

Presented at the 2001 NCPV Program Review Meeting: Group III-nitride-arsenide materials were studied by SIMS, XRD, and Profiler to determine small amounts of nitrogen that can lower the alloys bandgap significantly.