科技报告详细信息
| A TID and SEE Characterization of Multi-Terabit COTS 3D NAND Flash | |
| Wilcox, Edward P ; Campola, Michael J | |
| 关键词: IRRADIATION; TRAVELING IONOSPHERIC DISTURBANCES; SINGLE EVENT UPSETS; HEAVY IONS; RADIATION EFFECTS; ERROR ANALYSIS; | |
| RP-ID : GSFC-E-DAA-TN70578 | |
| 学科分类：电子与电气工程 | |
| 美国|英语 | |
| 来源: NASA Technical Reports Server | |
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【 摘 要 】
Single-event effects and total ionizing dose testing is described for a 32-layer NAND flash memory, in both SLC and MLC configurations, with special considerations for unique three-dimensional test results.
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 20190027271.pdf | 1523KB |  download |
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