Radiation Single Event Effects (SEE) Impact on Complex Avionics Architecture Reliability

Hodson, Robert F ; Morgan, Dwayne ; Ladbury, Raymond L ; Chen, Yuan ; Bay, Michael ; Zinchuk, Jeffrey

关键词: AVIONICS;    ELECTROMECHANICS;    MODELS;    PERFORMANCE TESTS;    RADIATION EFFECTS;    REDUNDANCY;    REDUNDANT COMPONENTS;    RISK ASSESSMENT;    SINGLE EVENT UPSETS;    SPACECRAFT COMPONENTS;    SYSTEM FAILURES;    SYSTEMS SIMULATION;   

RP-ID  :  NASA/TM-2019-220269,NESC-RP-17-01211,L-21015,NF1676L-32877

学科分类：航空航天科学

美国|英语

来源: NASA Technical Reports Server

【 摘 要 】

The NASA Engineering and Safety Center (NESC) has an urgent need to understand how system-level reliability of an avionics architecture is compromised when portions of the architecture are temporarily unavailable due to single event effects (SEE). The proposed activity parametrically evaluated these SEE impacts on system reliability based on mission duration, upset rate and recovery times for a representative redundant architecture. The key stakeholders for this study are NASA programs and projects that expect to use avionics architectures with electrical, electronic and electromechanical (EEE) parts susceptible to SEE when exposed to the mission expected radiation environment.