NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

Berg, Melanie D ; LaBel, Kenneth A

关键词: COMPLEXITY;    EVALUATION;    FIELD-PROGRAMMABLE GATE ARRAYS;    FLUENCE;    ION INJECTION;    LATCH-UP;    LINEAR ENERGY TRANSFER (LET);    MANUALS;    SINGLE EVENT UPSETS;    SYSTEMS ENGINEERING;   

RP-ID  :  GSFC-E-DAA-TN52006,GSFC-E-DAA-TN65829

学科分类：电子与电气工程

美国|英语

来源: NASA Technical Reports Server

【 摘 要 】

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.