Extreme Temperature Performance of Automotive-Grade Small Signal Bipolar Junction Transistors

Boomer, Kristen ; Damron, Benny ; Gray, Josh ; Hammoud, Ahmad

关键词: JUNCTION TRANSISTORS;    COMMERCIAL OFF-THE-SHELF PRODUCTS;    THERMAL CYCLING TESTS;    TEMPERATURE EFFECTS;    N-P-N JUNCTIONS;    DIRECT CURRENT;    ELECTRICAL FAULTS;    LUNAR BASES;    OPERATING TEMPERATURE;    AMPLIFICATION;   

RP-ID  :  GRC-E-DAA-TN46661

学科分类：电子与电气工程

美国|英语

来源: NASA Technical Reports Server

【 摘 要 】

Electronics designed for space exploration missions must display efficient and reliable operation under extreme temperature conditions. For example, lunar outposts, Mars rovers and landers, James Webb Space Telescope, Europa orbiter, and deep space probes represent examples of missions where extreme temperatures and thermal cycling are encountered. Switching transistors, small signal as well as power level devices, are widely used in electronic controllers, data instrumentation, and power management and distribution systems. Little is known, however, about their performance in extreme temperature environments beyond their specified operating range; in particular under cryogenic conditions. This report summarizes preliminary results obtained on the evaluation of commercial-off-the-shelf (COTS) automotive-grade NPN small signal transistors over a wide temperature range and thermal cycling. The investigations were carried out to establish a baseline on functionality of these transistors and to determine suitability for use outside their recommended temperature limits.